Characterization of 2D materials
We specialize in the comprehensive characterization of 2D materials, encompassing electrical, optical, and mechanical properties. This includes precise measurements using Atomic Force Microscopy (AFM) for mechanical analysis and charge transport studies. We also employ photoluminescence measurements to observe exciton complexes and analyze the band structure in both pristine 2D materials and their heterostructures. Additionally, we investigate the influence of electrostatic and magnetic fields on the properties of these materials. The characterization of 2D materials elucidates fundamental physical phenomena, advancing knowledge in condensed matter physics and nanotechnology. Our precise measurements and analyses pave the way for tailored applications in electronics, photonics, and quantum computing, promising high-performance devices and innovative technologies.